Empirical models for net-length probability distribution and applications

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Volumn 12, Issue 10, 2004, Pages 1066-1075

  Davoodi, Azadeh ^a   Khandelwal, Vishal ^a   Srivastava, Ankur ^a  

^a UNIVERSITY OF MARYLAND   (United States)

Author keywords

Empirical modeling; Interconnect prediction; Multiterminal nets; Probabilistic modeling

Indexed keywords

BENCHMARKING; CROSSTALK; OPTIMIZATION; PROBABILITY; WIRE;

EMPIRICAL MODELING; INTERCONNECT PREDICTION; MULTITERMINAL NETS; PROBABILISTIC MODELING;

VLSI CIRCUITS;

EID: 6344287275     PISSN: 10638210     EISSN: None     Source Type: Journal    
DOI: 10.1109/TVLSI.2004.834235     Document Type: Conference Paper

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