Affinity mass spectrometry from a tailored porous silicon surface

Chemical Communications

Volumn , Issue 18, 2004, Pages 2108-2109

  Meng, Jun Cai ^a   Siuzdak, Gary ^a   Finn, M G ^a  

^a SCRIPPS RESEARCH INSTITUTE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON; SILICON DIOXIDE;

ARTICLE; CHEMICAL BOND; COVALENT BOND; DESORPTION IONIZATION ON SILICON MASS SPECROMETRY; LASER; LYSIS; MASS; MASS SPECTROMETRY; MATERIALS; ON CHIP AFFINITY PURIFICATION; POROSITY; PURIFICATION; SURFACE PROPERTY;

EID: 6344278194     PISSN: 13597345     EISSN: None     Source Type: Journal    
DOI: 10.1039/b408200a     Document Type: Article

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