|
Volumn 386, Issue 1-2, 2004, Pages 68-73
|
The onset of secondary slip in the plastic deformation of tetrahedrally bound semiconductors
|
Author keywords
Dislocation core processes; Mechanisms of dislocation motion; Onset of secondary slip; Plasticity of semiconductors; Stress strain curve
|
Indexed keywords
ACTIVATION ENERGY;
DEFORMATION;
DOPING (ADDITIVES);
PHASE TRANSITIONS;
POSITRON ANNIHILATION SPECTROSCOPY;
SEMICONDUCTOR MATERIALS;
STRAIN RATE;
STRESS ANALYSIS;
THERMAL EFFECTS;
TRANSITION METALS;
DOPED SEMICONDUCTORS;
MICROSCOPIC DISLOCATION;
TRANSITION STRESS;
YIELD POINT;
PLASTIC DEFORMATION;
DEFORMATION;
PLASTIC;
SEMICONDUCTOR;
SLIP;
|
EID: 6344270097
PISSN: 09215093
EISSN: None
Source Type: Journal
DOI: 10.1016/j.msea.2004.07.015 Document Type: Article |
Times cited : (1)
|
References (28)
|