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Volumn 355, Issue 1-2, 2003, Pages 311-314

The interaction of boron and phosphorus with dislocations in silicon

Author keywords

Deformation models; Influence of doping; Interaction of impurity atmospheres with dislocations; Plasticity of silicon

Indexed keywords

DISLOCATIONS (CRYSTALS); DOPING (ADDITIVES); PHOSPHORUS; SILICON;

EID: 0038607563     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5093(03)00083-2     Document Type: Article
Times cited : (5)

References (21)
  • 2
    • 0011715331 scopus 로고    scopus 로고
    • R. Hull (Ed.) EMIS Datareviews Series No. 20, INSPEC London
    • H. Siethoff, in: R. Hull (Ed.), Properties of Crystalline Silicon, EMIS Datareviews Series No. 20, INSPEC London, 1999, pp. 122-135.
    • (1999) Properties of Crystalline Silicon , pp. 122-135
    • Siethoff, H.1
  • 4
    • 0003760432 scopus 로고    scopus 로고
    • R. Hull (Ed.) EMIS Datareviews Series No. 20, INSPEC London
    • N. Lehto, M.I. Heggie, in: R. Hull (Ed.), Properties of Crystalline Silicon, EMIS Datareviews Series No. 20, INSPEC London, 1999, pp. 357-378.
    • (1999) Properties of Crystalline Silicon , pp. 357-378
    • Lehto, N.1    Heggie, M.I.2
  • 11
    • 0005804456 scopus 로고
    • H. R. Huff, & E. Sirtl (Eds.), Princeton: The Electrochemical Society
    • Masetti G. Nobili D. Solmi S. Huff H.R. Sirtl E. Semiconductor Silicon 1977 1977 648-657 The Electrochemical Society Princeton
    • (1977) Semiconductor Silicon 1977 , pp. 648-657
    • Masetti, G.1    Nobili, D.2    Solmi, S.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.