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Volumn 2, Issue , 2004, Pages 13-16

A unified mobility model for excimer laser annealed complementary thin film transistors simulation

Author keywords

Complementary TFT mode; Excimer laser annealed; Gate induced mobility degradation; LTPS; SPICE mobility model

Indexed keywords

ANNEALING; CONVERGENCE OF NUMERICAL METHODS; LIQUID CRYSTAL DISPLAYS; MATHEMATICAL MODELS; MOSFET DEVICES; POLYCRYSTALLINE MATERIALS; THIN FILM TRANSISTORS;

EID: 6344239050     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (5)

References (7)
  • 1
    • 0037480751 scopus 로고    scopus 로고
    • A SPICE model for thin-film transistors fabricated on grain-enhanced polysilicon film
    • S. Jagar et al., "A SPICE model for thin-film transistors fabricated on grain-enhanced polysilicon film," IEEE Trans. Electron Devices 50, 1103, 2003.
    • (2003) IEEE Trans. Electron Devices , vol.50 , pp. 1103
    • Jagar, S.1
  • 2
    • 0000292141 scopus 로고    scopus 로고
    • A strategy for modeling of variations due to grain size in polycrystalline thin-film transistors
    • A. Wang and K. C. Saraswat, "A strategy for modeling of variations due to grain size in polycrystalline thin-film transistors," IEEE Trans. Electron Devices 47, 1035, 2000.
    • (2000) IEEE Trans. Electron Devices , vol.47 , pp. 1035
    • Wang, A.1    Saraswat, K.C.2
  • 3
    • 0035308163 scopus 로고    scopus 로고
    • On-current modeling of large-grain polycrystalline silicon thin-film transistors
    • F. V. Farmakis et al., "On-current modeling of large-grain polycrystalline silicon thin-film transistors," IEEE Trans. Electron Devices 48, 701, 2001.
    • (2001) IEEE Trans. Electron Devices , vol.48 , pp. 701
    • Farmakis, F.V.1
  • 4
    • 0038686207 scopus 로고    scopus 로고
    • A genetic algorithm approach to inGaP/GaAs HBT parameters extraction and RF characterization
    • Y. Li et al., "A Genetic Algorithm Approach to InGaP/GaAs HBT Parameters Extraction and RF Characterization," Jpn. J. Appl. Phys. 42, 2371, 2003.
    • (2003) Jpn. J. Appl. Phys. , vol.42 , pp. 2371
    • Li, Y.1
  • 5
    • 0033725312 scopus 로고    scopus 로고
    • S-TFT: An analytical model of polysilicon thin-film transistors for circuit simulation
    • G.-Y. Yang et al., :S-TFT: an analytical model of polysilicon thin-film transistors for circuit simulation," Proceedings of the IEEE Custom Integrated Circuits Conference, 213, 2000.
    • (2000) Proceedings of the IEEE Custom Integrated Circuits Conference , pp. 213
    • Yang, G.-Y.1
  • 7
    • 0031185434 scopus 로고    scopus 로고
    • Modeling of laser-annealed polysilicon TFT characteristics
    • G. A. Armstrong et al., "Modeling of Laser-Annealed Polysilicon TFT Characteristics," IEEE Electron Device Letters 18, 315, 1997.
    • (1997) IEEE Electron Device Letters , vol.18 , pp. 315
    • Armstrong, G.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.