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Volumn 3, Issue , 2003, Pages 29-32

Low-K carbon films deposited in low frequency discharge for sub-micron devices

Author keywords

Carbon films; Low K materials; Plasma deposition

Indexed keywords

CARBON; ELECTRIC BREAKDOWN; ELECTRIC RESISTANCE; FOURIER TRANSFORM INFRARED SPECTROSCOPY; INTEGRATED CIRCUITS; MICROSTRUCTURE; PERMITTIVITY; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; SILICA;

EID: 6344226189     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (3)

References (17)
  • 16
    • 6344230622 scopus 로고
    • Dielectric films in microelectronics
    • Moscow
    • V.F. Korzo and V.N. Cherniaev. Dielectric films in microelectronics. Moscow, "Energya", 197, 1977
    • (1977) Energya , pp. 197
    • Korzo, V.F.1    Cherniaev, V.N.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.