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Volumn 15, Issue 2, 1997, Pages 298-306

Effect of ion bombardment in very-high frequency glow discharge on growth and properties of SiHx films

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EID: 0031483278     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.580484     Document Type: Article
Times cited : (14)

References (13)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.