Measurement of the Gibbsian interfacial excess of solute at an interface of arbitrary geometry using three-dimensional atom probe microscopy

Materials Science and Engineering: A

Volumn 327, Issue 1, 2002, Pages 24-28

  Hellman, Olof C ^a   Seidman, David N ^a  

^a Northwestern University   (United States)

Author keywords

Atom probe microscopy; Gibbsian excess; Interface; Segregation

Indexed keywords

COMPUTATIONAL GEOMETRY; INTERFACIAL ENERGY; THERMODYNAMICS;

ATOM PROBE MICROSCOPY; INTERFACIAL THERMODYNAMICS;

MATERIALS SCIENCE;

MEASUREMENT METHOD;

EID: 0037090029     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5093(01)01885-8     Document Type: Article

References (11)

1. Atomic-scale measurement of composition profiles near growing precipitates in the Cu-Co system