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Volumn 16, Issue 5, 2009, Pages 187-194

Study of kinetic behaviors of GeO in GeO2/Ge stacks

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC DEVICES; GATE DIELECTRICS; HIGH-K DIELECTRIC; SPECTROSCOPIC ELLIPSOMETRY;

EID: 63149181611     PISSN: 19385862     EISSN: 19386737     Source Type: Conference Proceeding    
DOI: 10.1149/1.2981601     Document Type: Conference Paper
Times cited : (12)

References (18)
  • 15
    • 63149088553 scopus 로고    scopus 로고
    • M. Toyama, K. Kita, K. Kyuno, and A. Toriumi, Extended Abstracts of 2004 Int. Conf. Solid State Dev. Mater., pp. 226-227 (2004).
    • M. Toyama, K. Kita, K. Kyuno, and A. Toriumi, Extended Abstracts of 2004 Int. Conf. Solid State Dev. Mater., pp. 226-227 (2004).
  • 18
    • 63149116830 scopus 로고    scopus 로고
    • C. H. Lee, T. Nishimura, K. Nagashio, K. Kita, and A. Toriumi, in submission.
    • C. H. Lee, T. Nishimura, K. Nagashio, K. Kita, and A. Toriumi, in submission.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.