Distinctly different thermal decomposition pathways of ultrathin oxide layer on Ge and Si surfaces

Applied Physics Letters

Volumn 76, Issue 16, 2000, Pages 2244-2246

  Prabhakaran, K ^a   Maeda, F ^a   Watanabe, Y ^a   Ogino, T ^a  

^a Kashino Diverse Brain Research Laboratory of NTT Communication Science Laboratories   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0008917498     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.126309     Document Type: Article

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