Recent progress in SiC DMOSFETs and JBS diodes at Cree

IECON Proceedings (Industrial Electronics Conference)

Volumn , Issue , 2008, Pages 2885-2890

  Callanan, Robert J ^a   Agarwal, Anant ^a   Burk, Al ^a   Das, Mrinal ^a   Hull, Brett ^a   Husna, Fatima ^a   Powell, Adrian ^a   Richmond, Jim ^a   Ryu, Sei Hyung ^a   Zhang, Qingchun ^a  

^a Arkansas Power Electronics International Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIES; DIODES; INDUSTRIAL ELECTRONICS; SCHOTTKY BARRIER DIODES; SILICON CARBIDE;

DIE AREAS; ELECTRONICS APPLICATIONS; FUTURE TRENDS; JUNCTION BARRIER SCHOTTKY DIODES; POWER DEVICES; POWER LOSS; RECENT PROGRESS; REVERSE RECOVERIES; SI DEVICES;

SEMICONDUCTING SILICON COMPOUNDS;

EID: 63149095671     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IECON.2008.4758417     Document Type: Conference Paper

References (20)

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