Syntheses, crystal structures, and characterization of As(III) and As(V) thioarsenates, [Mn2(phen)(AsIII2S5)]n and [Mn3(phen)3(AsvS4)2]n·nH2O

Journal of Solid State Chemistry

Volumn 182, Issue 4, 2009, Pages 913-919

  Wang, Xin ^a,b   Sheng, Tian Lu ^a   Hu, Sheng Min ^a   Fu, Rui Biao ^a   Chen, Jian Shan ^a   Wu, Xin Tao ^a  

^a FUJIAN INSTITUTE OF RESEARCH ON THE STRUCTURE OF MATTER   (China)

^b UNIVERSITY OF CHINESE ACADEMY OF SCIENCES   (China)

Author keywords

Magnetism; Manganese; Multiple physical properties; Semiconductor; Thermoanalysis; Thioarsenate(III)

Indexed keywords

ANTIFERROMAGNETISM; DIFFRACTION; ELECTRIC CONDUCTIVITY; MAGNETIC SUSCEPTIBILITY; MANGANESE COMPOUNDS; PHYSICAL PROPERTIES; SEMICONDUCTOR MATERIALS; THERMOGRAVIMETRIC ANALYSIS; X RAY DIFFRACTION ANALYSIS;

ANTIFERRO-MAGNETIC INTERACTIONS; AS AND AS(V); BAND GAPS; CHAIN STRUCTURES; ELEMENTAL ANALYSIS; ETHYLENEDIAMINE; HYDROTHERMAL REACTIONS; MULTIPLE PHYSICAL PROPERTIES; ONE-DIMENSIONAL; PHENANTHROLINE; POROUS LAYERS; SEMICONDUCTOR; SINGLE-CRYSTAL X-RAY DIFFRACTION ANALYSIS; THIOARSENATE(III); TWO-DIMENSIONAL; VARIABLE TEMPERATURES; X-RAY POWDER DIFFRACTIONS;

MANGANESE;

EID: 62849125538     PISSN: 00224596     EISSN: 1095726X     Source Type: Journal    
DOI: 10.1016/j.jssc.2009.01.021     Document Type: Article

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