A high-speed CMOS image sensor with column-parallel two-step single-slope ADCs

IEEE Transactions on Electron Devices

Volumn 56, Issue 3, 2009, Pages 393-398

  Lim, Seunghyun ^a   Lee, Jeonghwan ^a   Kim, Dongsoo ^a   Han, Gunhee ^a  

^a Yonsei University   (South Korea)

Author keywords

Column parallel ADC; Single slope (SS) ADC; Two step ADC

Indexed keywords

DIGITAL CAMERAS; DIGITAL IMAGE STORAGE; ERROR CORRECTION; IMAGE SENSORS; PIXELS;

CMOS IMAGE SENSORS; CMOS PROCESS; COLUMN-PARALLEL ADC; CONVERSION TIME; DEAD BANDS; ERROR-CORRECTION SCHEMES; HIGH-SPEED; MEASUREMENT RESULTS; POWER CONSUMPTION; PROTOTYPE SENSORS; SINGLE-SLOPE (SS) ADC; SUPPLY VOLTAGES; TWO-STEP ADC;

MULTICARRIER MODULATION;

EID: 62749178567     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2008.2011846     Document Type: Article

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