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Volumn 50, Issue 1, 2003, Pages 130-135

A high-speed, 240-frames/s, 4.1-mpixel cmos sensor

Author keywords

CMOS image sensor; High speed imaging; Machine vision

Indexed keywords

ANALOG TO DIGITAL CONVERSION; CMOS INTEGRATED CIRCUITS; COMPUTER VISION; INTEGRATED CIRCUIT LAYOUT;

EID: 0037247586     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2002.806961     Document Type: Article
Times cited : (58)

References (9)
  • 5
    • 0031246976 scopus 로고    scopus 로고
    • CMOS active pixel sensor with on-chip successive approximation analog-to-digital converter
    • Oct
    • Z. Zhou, B. Pain, and E. Fossum, "CMOS active pixel sensor with on-chip successive approximation analog-to-digital converter," IEEE Trans. Electron Devices, vol. 44, pp. 1759-1763, Oct. 1997.
    • (1997) IEEE Trans. Electron Devices , vol.44 , pp. 1759-1763
    • Zhou, Z.1    Pain, B.2    Fossum, E.3
  • 6
    • 25344464116 scopus 로고    scopus 로고
    • Charge domain analog readout for image sensor
    • U.S. Patent 6 222 175, Apr. 24
    • A. Krymski, "Charge domain analog readout for image sensor," U.S. Patent 6 222 175, Apr. 24, 2001.
    • (2001)
    • Krymski, A.1
  • 7
    • 0012781862 scopus 로고    scopus 로고
    • CMOS voltage comparator
    • U.S. Patent 6 184 721, Feb. 6
    • ____, "CMOS voltage comparator," U.S. Patent 6 184 721, Feb. 6, 2001.
    • (2001)
    • Krymski, A.1
  • 9
    • 0003385091 scopus 로고    scopus 로고
    • Analysis and enhancement of low-light-level performance of photodiode-type CMOS active pixel imagers operated with sub-threshold reset
    • B. Pain, et al. "Analysis and enhancement of low-light-level performance of photodiode-type CMOS active pixel imagers operated with sub-threshold reset," in Proc. 1999 IEEE Workshop on CCD's and Advanced Image Sensors, pp. 140-143.
    • Proc. 1999 IEEE Workshop on CCD's and Advanced Image Sensors , pp. 140-143
    • Pain, B.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.