Atomic mechanism of radiation-induced erosion of field electron emitters

Surface and Interface Analysis

Volumn 36, Issue 5-6 SPEC. ISS., 2004, Pages 510-514

  Mazilova, T I ^a   Mikhailovskij, I M ^a  

^a KHARKOV INSTITUTE OF PHYSICS AND TECHNOLOGY   (Ukraine)

Author keywords

Field electron emitters; Field ion microscopy; In situ specimen treatment

Indexed keywords

COLD CATHODE TUBES; CURRENT DENSITY; ELECTRON BEAMS; EROSION; IN SITU COMBUSTION; INERT GASES; IONS; SPUTTERING; SURFACE ROUGHNESS; TUNGSTEN COMPOUNDS;

ATOM DISPLACEMENT; FIELD ELECTRON EMITTERS; FIELD ION MICROSCOPY; IN SITU SPECIMEN TREATMENT;

ELECTRON EMISSION;

EID: 3042651229     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.1731     Document Type: Conference Paper

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