A simple measurement of the absolute internal quantum efficiency of thin organic films

Journal of Applied Physics

Volumn 87, Issue 11, 2000, Pages 7802-7804

  Nollau, A ^a   Hoffmann, M ^a   Floreck, K ^a   Fritz, T ^a   Leo, K ^a  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0011893732     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.373458     Document Type: Article

References (11)

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