Design, manufacturing, and testing of single-carbon-nanotube-based infrared sensors

IEEE Transactions on Nanotechnology

Volumn 8, Issue 2, 2009, Pages 245-251

  Zhang, Jiangbo ^a   Xi, Ning ^a   Chen, Hongzhi ^a   Lai, King Wai Chiu ^a   Li, Guangyong ^b   Wejinya, Uchechukwu C ^c  

^a Michigan State University   (United States)

^b University of Pittsburgh   (United States)

^c University of Arkansas   (United States)

Author keywords

Atomic force microscopy (AFM); Carbon nanotube (CNT); IR sensor; Nanomanipulation; Nanomanufacturing

Indexed keywords

ATOMIC FORCE MICROSCOPY; ATOMS; ELECTRONIC PROPERTIES; INFRARED DETECTORS; MICROMANIPULATORS; NANOELECTRONICS; OPTICAL SENSORS; SENSOR NETWORKS; SINGLE-WALLED CARBON NANOTUBES (SWCN);

ATOMIC FORCE MICROSCOPY (AFM); DARK CURRENT RATIOS; ELECTRODE GAPS; EXPERIMENTAL TESTS; INFRA-RED SENSORS; IR SENSOR; MULTI-WALLED; NANO-DEVICES; NANO-ELECTRONIC DEVICES; NANOMANIPULATION; NANOMANUFACTURING; NANOSTRUCTURAL MATERIALS; OR-NETWORKS; PHOTONIC PROPERTIES; SINGLE-WALLED; SUBSTRATE SURFACES;

CARBON NANOTUBES;

EID: 62449236685     PISSN: 1536125X     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNANO.2008.2008024     Document Type: Article

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