Photogenerated free carrier dynamics in metal and semiconductor single-walled carbon nanotube films

Nano Letters

Volumn 8, Issue 12, 2008, Pages 4238-4242

  Beard, Matthew C ^a   Blackburn, Jeffrey L ^a   Heben, Michael J ^b  

^a NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

^b UNIVERSITY OF TOLEDO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER DYNAMICS; EXCITATION WAVELENGTHS; EXCITON DISSOCIATIONS; FREE-CARRIER DYNAMICS; FREE-CARRIERS; LOW LIGHTS; PHOTOGENERATED CHARGES; SINGLE-WALLED CARBONS; THZ SPECTROSCOPIES; TIME-RESOLVED; TRANSPARENT FILMS; TUBE TYPES;

CARBON FILMS; CARBON NANOTUBES; CHARGE CARRIERS; DISSOCIATION; DYNAMICS; EXCITONS; SEMICONDUCTING FILMS;

SINGLE-WALLED CARBON NANOTUBES (SWCN);

EID: 61649120351     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl801913y     Document Type: Article

References (36)

1. Jones, M.; Engtrakul, C.; Metzger, W. K.; Ellingson, R. J.; Nozik, A. J.; Heben, M. J.; Rumbles, G. Phys. Rev. B 2005, 71, 115426.
2. Cognet, L.; Tsyboulski, D. A.; Rocha, J. D. R.; Doyle, C. D.; Tour, J. M.; Weisman, R. B. Science 2007, 316, 1465.
3. Qiu, X. H.; Freitag, M.; Perebeinos, V.; Avouris, P. Nano Lett. 2005, 5, 749.
4. Beard, M. C.; Turner, G. M.; Schmuttenmaer, C. A. Phys. Rev. B 2000, 62, 15764.
5. Beard, M. C.; Turner, G. M.; Schmuttenmaer, C. A. J. Appl. Phys. 2001, 90, 5915.
6. Blackburn, J.; Barnes, T.; Beard, M. C.; Kim, Y.; Engtrakul, C.; McDonald, T.; Courts, T.; Heben, M. ACS Nano 2008, 2, 1266.
7. Arnold, M. S.; Green, A. A.; Hulvat, J. F.; Stupp, S. I.; Hersam, M. C. Nat. Nanotechnol 2006, 1, 60.
8. Huang, L. B.; Krauss, T. D. Phys. Rev. Lett. 2006, 96, 057407.
9. Honold, A.; Schultheis, L.; Kuhl, J.; Tu, C. W. Phys. Rev. B 1989, 40, 6442.
10. Perebeinos, V.; Avouris, P. Phys. Rev. Lett. 2008, 101, 4.
11. Dettlaff-Weglikowska, U.; Skakalova, V.; Graupner, R.; Jhang, S. H.; Kim, B. H.; Lee, H. J.; Ley, L.; Park, Y. W.; Berber, S.; Tomanek, D.; Roth, S. J. Am. Chem. Soc. 2005, 127, 5125.
12. Turner, G. M.; Beard, M. C.; Schmuttenmaer, C. A. J. Phys. Chem. B 2002, 106, 11716.
13. The frequency-dependent complex-conductivity for a truly "free" carrier is markedly different than that of a bound carrier, since the conductivity of a completely free carrier should increase with decreasing frequency and exhibit a maximum value in σ′ at dc. 1.
14. Barnes, T. M.; Blackburn, J. L.; van de Lagemaat, J.; Courts, T. J.; Heben, M. J. ACS Nano 2008, 2, 1968.
15. Jeon, T. I.; Kim, K. J.; Kang, C.; Oh, S. J.; Son, J. H.; An, K. H.; Bae, D. J.; Lee, Y. H. Appl. Phys. Lett. 2002, 80, 3403.
16. Kang, C.; Maeng, I. H.; Oh, S. J.; Lim, S. C.; An, K. H.; Lee, Y. H.; Son, J. H. Phys. Rev. B 2007, 75, 085410.
17. -1 (hydrazine treated s-SWNT film) at 1 THz for a 50 nm thick film. We must conclude that there are significant differences between our sample and those studied elsewhere and stress that samples separated by density gradient separation, such as those studied here, are among the most pure, optimal samples for studying the conductive properties truly representative of the single-walled carbon nanotubes.
18. Hua, X.; Anlage, S. M.; Liangbing, H.; Gruner, G. Appl. Phys. Lett. 2007, 90, 183119.
19. Hilt, O.; Brom, H. B.; Ahlskog, M. Phys. Rev. B 2000, 61, R5129.
20. Smith, N. V. Phys. Rev. B 2001, 64, 155106.
21. Cooke, D. G.; MacDonald, A. N.; Hryciw, A.; Wang, J.; Li, Q.; Meldrum, A.; Hegmann, F. A. Phys. Rev. B 2006, 73, 193311.
22. Walther, M.; Cooke, D. G.; Sherstan, C.; Hajar, M.; Freeman, M. R.; Hegmann, F. A. Phys. Rev. B 2007, 76, 125408.
23. Bekyarova, E.; Itkis, M. E.; Cabrera, N.; Zhao, B.; Yu, A. P.; Gao, J. B.; Haddon, R. C. J. Am. Chem. Soc. 2005, 127, 5990.
24. Metal-enriched films show similar trends compared to the DOS calculation; see Supporting Information.
25. Ugawa, A.; Rinzler, A. G.; Tanner, D. B. Phys. Rev. B 1999, 60, R11305.
26. Perfetti, L.; Kampfrath, T.; Schapper, F.; Hagen, A.; Hertel, T.; Aguirre, C. M.; Desjardins, P.; Mattel, R.; Frischkorn, C.; Wolf, M. Phys. Rev. Lett. 2006, 96, 027401.
27. Kampfrath, T.; Perfetti, L.; von Volkmann, K.; Aguirre, C. M.; Desjardins, P.; Martel, R.; Frischkorn, C.; Wolf, M. Phys. Status Solidi B 2007, 244, 3950.
28. Ouyang, M.; Huang, J. L.; Cheung, C. L.; Lieber, C. M. Science 2001, 292, 702.
29. Delaney, P.; Choi, H. J.; Ihm, J.; Louie, S. G.; Cohen, M. L. Nature 1998, 391, 466.
30. Maarouf, A. A.; Kane, C. L.; Mele, E. J. Phys. Rev. B 2000, 61, 11156.
31. Zhou, W.; Vavro, J.; Nemes, N. M.; Fischer, J. E.; Borondics, F.; Kamaras, K.; Tanner, D. B. Phys. Rev. B 2005, 71, 205423.
32. Arkhipov, V. I.; Bassler, H. Phys. Status Solidi A 2004, 201, 1152.
33. Kuriyama, K.; Dresselhaus, M. S. Phys. Rev. B 1991, 44, 8256.
34. Kampfrath, T.; Perfetti, L.; Schapper, F.; Frischkorn, C.; Wolf, M. Phys. Rev. Lett. 2005, 95, 187403.
35. Hertel, T.; Moos, G. Chem. Phys. Lett. 2000, 320, 359.
36. While the cooling rate may be faster than our instrument response function, we would still expect to see a different amplitude for faster cooling rates even if our measured responses were dominated by electron cooling. This is not observed.