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Volumn 44, Issue 5, 2009, Pages 1051-1057

Optimized deposition and characterization of nanocrystalline magnesium indium oxide thin films for opto-electronic applications

Author keywords

A. Thin films; B. Chemical synthesis; C. Atomic force microscopy; C. X ray diffraction; D. Electrical properties

Indexed keywords

ATOMIC FORCE MICROSCOPY; ATOMS; CARRIER CONCENTRATION; CHARGE TRANSFER; CONDUCTIVE FILMS; DIFFRACTION; ELECTRIC CONDUCTIVITY; ELECTRON MOBILITY; GALVANOMAGNETIC EFFECTS; GAS SENSING ELECTRODES; HALL MOBILITY; INDIUM; ION EXCHANGE; MAGNESIUM; MAGNESIUM PRINTING PLATES; METAL IONS; OPTOELECTRONIC DEVICES; OXIDE MINERALS; OXYGEN; OXYGEN VACANCIES; QUARTZ; SYNTHESIS (CHEMICAL); THIN FILMS; X RAY DIFFRACTION;

EID: 61549134542     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.materresbull.2008.10.020     Document Type: Article
Times cited : (9)

References (47)
  • 8
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    • Klauk H. Nature 451 (2008) 533
    • (2008) Nature , vol.451 , pp. 533
    • Klauk, H.1
  • 36
    • 61549132146 scopus 로고    scopus 로고
    • Joint Commission of Powder Diffraction Data Files, PCPDFWIN, Version 1.30, Pennsylvania, 1997
    • Joint Commission of Powder Diffraction Data Files, PCPDFWIN, Version 1.30, Pennsylvania, 1997.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.