Simple method for determination of the thickness of a nonabsorbing thin film using spectral reflectance measurement

Applied Optics

Volumn 48, Issue 5, 2009, Pages 985-989

  Luňáček, Jiři ^a   Hlubina, Petr ^a   Luňáčková, Milena ^a  

^a VSB TECHNICAL UNIVERSITY OF OSTRAVA   (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

ALGEBRA; FILM THICKNESS; REFLECTION; SUBSTRATES;

ABSORBING SUBSTRATES; FITTING METHOD; LINEAR RELATION; OPTICAL PARAMETER; REFLECTANCE SPECTRUM; SIMPLE METHOD; SPECTRAL REFLECTANCE MEASUREMENTS; THIN-FILM STRUCTURE;

THIN FILMS;

EID: 61449242890     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.48.000985     Document Type: Article

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