Determination of the optical constants and thickness of thin films on slightly absorbing substrates

Applied Optics

Volumn 34, Issue 34, 1995, Pages 7914-7924

  Rusli, ^a   Amaratunga, G A J ^a,b  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b UNIVERSITY OF LIVERPOOL   (United Kingdom)

Author keywords

Optical constants; Reflectance; Si; Thin films

Indexed keywords

AMORPHOUS FILMS; AMORPHOUS SILICON; OPTICAL CONSTANTS; OPTICAL PROPERTIES; REFLECTION; REFRACTIVE INDEX; SILICON; SUBSTRATES; THIN FILMS;

ABSORBING SUBSTRATES; ABSORPTION CHARACTERISTICS; INTERFERENCE FRINGE; MULTIPLE SOLUTIONS; REAL AND IMAGINARY;

OPTICAL FILMS;

EID: 84906316541     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.34.007914     Document Type: Article

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