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Volumn 46, Issue 21, 2007, Pages 4660-4666

Direct calculation of the optical constants for a thin film using a midpoint envelope

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; COMPUTATIONAL METHODS; OPTICAL CONSTANTS; REFLECTION; SPECTRUM ANALYSIS; THIN FILMS;

EID: 34548591716     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.46.004660     Document Type: Article
Times cited : (18)

References (17)
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  • 2
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    • Characterizing optical thin films (I)
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    • Morton, D.E.1
  • 5
    • 84957232667 scopus 로고
    • Determining refractive index and thickness of thin films from wavelength measurements only
    • R. Swanepoel, "Determining refractive index and thickness of thin films from wavelength measurements only," J. Opt. Soc. Am. A 2, 1339-1343 (1985).
    • (1985) J. Opt. Soc. Am. A , vol.2 , pp. 1339-1343
    • Swanepoel, R.1
  • 6
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    • R. and G. A. J. Amaratunga, Determination of the optical constants and thickness of thin films on slightly absorbing substrates, Appl. Opt. 34, 7914-7924 (1995).
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    • Calculation of the optical constants of a thin layer upon a transparent substrate from the reflection spectrum
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    • (1989) J. Phys. D , vol.22 , pp. 1157-1161
    • Minkov, D.A.1
  • 9
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    • Algebraic method for extracting thin film optical parameters from spectrophotometer measurements
    • W. E. Case, "Algebraic method for extracting thin film optical parameters from spectrophotometer measurements," Appl. Opt. 22, 1832-1836 (1983).
    • (1983) Appl. Opt , vol.22 , pp. 1832-1836
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  • 10
    • 84975649447 scopus 로고    scopus 로고
    • b) method, Appl. Opt. 30, 27952800 (1991).
    • b) method," Appl. Opt. 30, 27952800 (1991).
  • 11
    • 0026261131 scopus 로고
    • Determination of optical parameters for amorphous thin film materials on semitransparent substrates from transmittance and reflectance measurements
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  • 12
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  • 13
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.