Structure and optical anisotropy of pulsed-laser deposited TiO 2 films for optical applications

Applied Surface Science

Volumn 255, Issue 10, 2009, Pages 5275-5279

  Stankova, Nadya E ^a   Dimitrov, Ivan G ^a   Stoyanchov, Toshko R ^a   Atanasov, Petar A ^a   Kovacheva, D ^b  

^a INSTITUTE OF ELECTRONICS   (Bulgaria)

^b INSTITUTE OF GENERAL AND INORGANIC CHEMISTRY   (Bulgaria)

Author keywords

Birefringence; Optical gas sensors; Pulsed laser deposition; Single mode TiO 2 waveguiding films

Indexed keywords

ANISOTROPY; ATOMIC FORCE MICROSCOPY; BIREFRINGENCE; OPTICAL PROPERTIES; OXIDE MINERALS; PULSED LASER DEPOSITION; PULSED LASERS; SCANNING ELECTRON MICROSCOPY; SILICA; SURFACE ROUGHNESS; TITANIUM DIOXIDE; WAVEGUIDES; X RAY DIFFRACTION;

ANISOTROPIC PROPERTY; CRYSTALLINE FILMS; GROWTH MORPHOLOGY; M-LINE SPECTROSCOPY; OPTICAL APPLICATIONS; OPTICAL GAS SENSORS; STRONG DEPENDENCES; WAVEGUIDING FILMS;

OPTICAL FILMS;

EID: 61349169571     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2008.07.203     Document Type: Article

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