Time resolved Nomarski interferometery of laser produced plasma plumes

Applied Surface Science

Volumn 255, Issue 10, 2009, Pages 5167-5171

  Hough, P ^a   McLoughlin, C ^a   Kelly, T J ^a   Harilal, S S ^b   Mosnier, J P ^a   Costello, J T ^a  

^a DUBLIN CITY UNIVERSITY   (Ireland)

^b Prism Computational Sciences Inc   (United States)

Author keywords

Electron density; Interferometery; Laser; Nomarski; Plasma; Plasma scale length; Pulsed laser deposition

Indexed keywords

CARRIER CONCENTRATION; ELECTRON DENSITY MEASUREMENT; LASER PRODUCED PLASMAS; LASERS; PHASE INTERFACES; PLASMAS; PULSED LASER DEPOSITION; SHOCK WAVES; THERMAL PLUMES;

BACKGROUND GAS; BACKGROUND PRESSURE; ELECTRON DENSITY PROFILES; INTERFEROMETERY; NOMARSKI; PLASMA BREAKDOWN; RESEARCH DOMAINS; SCALE LENGTH;

PULSED LASERS;

EID: 61349158566     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2008.08.050     Document Type: Article

References (26)

1. Gupta R.K., Mamidi N., Ghosh K., Mishra S.R., and Kahol P.K. J. Optoelectr. Adv. Mater. 9 7 (2007) 2211-2216
2. Borrajo J.P., Serra J., Liste S., González P., Chiussi S., León B., and Pérez-Amor M. Appl. Surf. Sci. 248 (2005) 355-359
3. Cattaneo D., Righetti N., Casari C.S., Bassi A.L., and Bottani C.E. Appl. Surf. Sci. 253 (2007) 7917-7921
4. Rajesh D., Adhikary K., and Ray S. Jpn. J. Appl. Phys. 47 3 (2008) 1501-1506
5. Li F., Son D.-I., Leem J.-H., Kim T.W., Dong W., and Kim Y.-H. J.. Appl. Phys. 103 (2008) 073511
6. Rajendra Kumar R.T., McGlynn E., McLoughlin C., Chakrabarti S., Smith R.C., Carey J.D., Mosnier J.P., and Henry M.O. Nanotechnology 18 (2007) 215704
7. Ghule K., Ghule A.V., Chen B.-J., and Ling Y.-C. Green Chem. 8 (2006) 1034-1041
8. Kin T.-W., Kawazoea T., Yamazakib S., Limb J., Yatsuia T., and Ohtsua M. Solid State Commun. 127 (2003) 21-24
9. Doria D., Kavanagh K.D., Costello J.T., and Luna H. Meas. Sci. Technol. 17 (2006) 670-674
10. Harilal S.S., O'Shay B., Tao Y., and Tillack M.S. J. Appl. Phys. 99 (2006) 083303
11. Bailini A., and Ossi P.M. Europhys. Lett. 79 (2007) 35002
12. Sagisaka A., Daido H., Ogura K., Orimo S., Hayashi Y., Nishiuchi M., Mori M., Matsukado K., Fukumi A., Li Z., Nakamura S., Takagaki K., Hazama H., Suzuki M., Utsumi T., Bulanov S.V., and Esirkepov T. Appl. Phys. B 78 (2004) 919-922
13. Benattar R., Popovics C., and Sigel R. Rev. Sci. Instrum. 50 (1979) 12
14. Ruiz-Camacho J., Beg F.N., and Lee P. J. Phys. D: Appl. Phys. 40 (2007) 2026-2032
15. Hipp M., Woisetschläger J., Reiterer P., and Neger T. Measurement 36 (2004) 53-66
16. K. Kavanagh, Thesis, submitted for publication.
17. National Institute of Standards and Technology. http://physics.nist.gov/PhysRefData/ASD/.
18. Santala M.I.K., Zepf M., Watts I., Beg F.N., Clark E., Tatarakis M., Krushelnick K., Dangor A.E., McCanny T., Spencer I., Singhal R.P., Ledingham K.W.D., Wilks S.C., Machacek A.C., Wark J.S., Allott R., Clarke R.J., and Norreys P.A. Phys. Rev. Lett. 84 (2000) 7
19. Amoruso S., Schou J., and Lunney J.G. EuroPhys. Lett. 76 3 (2006) 436-442
20. Liu C.L., Leboeuf J.N., Wood R.F., Geobegan D.B., Donato J.M., Chen K.R., and Puretzky A.A. Mater. Sci. Eng. B47 (1997) 70-77
21. Leboeuf J.N., Chen K.R., Donato J.M., Geohegan D.B., Liu C.L., Puretzky A.A., and Wood R.F. Phys. Plasmas 3 5 (1996) 2203-2209
22. Gonzola J., Vega F., and Alfonso C.N. J. Appl. Phys. 77 12 (1995) 6588-6593
23. Sing R.K., Kumar A., Patel B.G., and Subramanian K.P. J. Appl. Phys. 101 (2007) 103301
24. Leboeuf J.N., Tajima T., and Dawson J.M. J. Comp. Phys. 31 3 (1979) 379-408
25. Harilal S.S., Bindhu C.V., Tillack M.S., Najmabadi F., and Gaeris A.C. J. Phys. D: Appl. Phys. 35 (2002) 2935-2938
26. Budtz-Jorgensen C.V., Mond M.M., Doggett B., and Lunney J.G. J. Phys. D: Appl. Phys. 38 (2005) 12