-
1
-
-
0023029053
-
Vibration measurement using phase-shifting time-average holographic interferometry
-
Nakadate S. Vibration measurement using phase-shifting time-average holographic interferometry. Appl Opt 25 22 (1986) 4155-4161
-
(1986)
Appl Opt
, vol.25
, Issue.22
, pp. 4155-4161
-
-
Nakadate, S.1
-
2
-
-
18844460904
-
Measurement of transient deformations with dual-pulse addition electronic speckle-pattern interferometry
-
Farrant D.I., Kaufmann G.H., Petzing J.N., Tyrer J.R., Oreb B.F., and Kerr D. Measurement of transient deformations with dual-pulse addition electronic speckle-pattern interferometry. Appl Opt 37 31 (1998) 7259-7267
-
(1998)
Appl Opt
, vol.37
, Issue.31
, pp. 7259-7267
-
-
Farrant, D.I.1
Kaufmann, G.H.2
Petzing, J.N.3
Tyrer, J.R.4
Oreb, B.F.5
Kerr, D.6
-
3
-
-
0000280264
-
Phase-shifted dynamic speckle pattern interferometry at 1 kHz
-
Huntley J.M., Kaufmann G.H., and Kerr D. Phase-shifted dynamic speckle pattern interferometry at 1 kHz. Appl Opt 38 31 (1999) 6556-6563
-
(1999)
Appl Opt
, vol.38
, Issue.31
, pp. 6556-6563
-
-
Huntley, J.M.1
Kaufmann, G.H.2
Kerr, D.3
-
4
-
-
18444411982
-
Speckle interferometry with temporal phase evaluation for measuring large-object deformation
-
Joenathan C., Franze B., Haible P., and Tiziani H.J. Speckle interferometry with temporal phase evaluation for measuring large-object deformation. Appl Opt 37 13 (1998) 2608-2614
-
(1998)
Appl Opt
, vol.37
, Issue.13
, pp. 2608-2614
-
-
Joenathan, C.1
Franze, B.2
Haible, P.3
Tiziani, H.J.4
-
5
-
-
0037370418
-
Phase measurement in temporal speckle pattern interferometry using the Fourier transform method with and without a temporal carrier
-
Kaufmann G.H. Phase measurement in temporal speckle pattern interferometry using the Fourier transform method with and without a temporal carrier. Opt Commun 217 (2003) 141-149
-
(2003)
Opt Commun
, vol.217
, pp. 141-149
-
-
Kaufmann, G.H.1
-
6
-
-
0002982140
-
Continual deformation analysis with scanning phase method and time sequence phase method in temporal speckle pattern interferometry
-
Li X., Tao G., and Yang Y. Continual deformation analysis with scanning phase method and time sequence phase method in temporal speckle pattern interferometry. Opt Laser Technol 33 (2001) 53-59
-
(2001)
Opt Laser Technol
, vol.33
, pp. 53-59
-
-
Li, X.1
Tao, G.2
Yang, Y.3
-
7
-
-
0019927495
-
Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry
-
Takeda M., Ina H., and Kobayashi S. Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry. J Opt Soc Am 72 (1982) 156-160
-
(1982)
J Opt Soc Am
, vol.72
, pp. 156-160
-
-
Takeda, M.1
Ina, H.2
Kobayashi, S.3
-
8
-
-
33750152005
-
Two-dimensional windowed Fourier transform for fringe pattern analysis: Principles, applications and implementations
-
Qian K. Two-dimensional windowed Fourier transform for fringe pattern analysis: Principles, applications and implementations. Opt Laser Eng 45 (2007) 304-317
-
(2007)
Opt Laser Eng
, vol.45
, pp. 304-317
-
-
Qian, K.1
-
9
-
-
0141531003
-
Phase-shifting windowed Fourier ridges for determination of phase derivatives
-
Qian K., Seah S.H., and Asundi A. Phase-shifting windowed Fourier ridges for determination of phase derivatives. Opt Lett 28 18 (2003) 1657-1659
-
(2003)
Opt Lett
, vol.28
, Issue.18
, pp. 1657-1659
-
-
Qian, K.1
Seah, S.H.2
Asundi, A.3
-
10
-
-
78951486040
-
Interferometric deformation measurement using object induced dynamic phase shifting
-
Colonna de Lega X, Jacquot P. Interferometric deformation measurement using object induced dynamic phase shifting. In: Proc SPIE. Vol. 2782. 1996, pp. 169-79.
-
(1996)
Proc SPIE
, vol.2782
, pp. 169-179
-
-
Colonna de Lega, X.1
Jacquot, P.2
-
11
-
-
11244277085
-
Temporal wavelet analysis for deformation and velocity measurement in speckle interferometry
-
Fu Y., Tay C.J., Quan C., and Chen L.J. Temporal wavelet analysis for deformation and velocity measurement in speckle interferometry. Opt Eng 43 11 (2004) 2780-2787
-
(2004)
Opt Eng
, vol.43
, Issue.11
, pp. 2780-2787
-
-
Fu, Y.1
Tay, C.J.2
Quan, C.3
Chen, L.J.4
-
12
-
-
0002425705
-
Digital image formation from electronically detected holograms
-
Goodman J.W., and Lawrence R.W. Digital image formation from electronically detected holograms. Appl Phys Lett 11 (1967) 77-79
-
(1967)
Appl Phys Lett
, vol.11
, pp. 77-79
-
-
Goodman, J.W.1
Lawrence, R.W.2
-
14
-
-
33749483463
-
Amplitude and phase analysis in digital dynamic holography
-
Asundi A., and Singh V.R. Amplitude and phase analysis in digital dynamic holography. Opt Lett 31 16 (2006) 2420-2422
-
(2006)
Opt Lett
, vol.31
, Issue.16
, pp. 2420-2422
-
-
Asundi, A.1
Singh, V.R.2
-
15
-
-
33745799431
-
High-speed digital holographic interferometry for vibration measurement
-
Pedrini G., Osten W., and Gusev M.E. High-speed digital holographic interferometry for vibration measurement. Appl Opt 45 15 (2006) 3456-3462
-
(2006)
Appl Opt
, vol.45
, Issue.15
, pp. 3456-3462
-
-
Pedrini, G.1
Osten, W.2
Gusev, M.E.3
-
16
-
-
35948999658
-
Vibration measurement by temporal Fourier analyses of digital hologram sequence
-
Fu Y., Pedrini G., and Osten W. Vibration measurement by temporal Fourier analyses of digital hologram sequence. Appl Opt 46 23 (2007) 5719-5727
-
(2007)
Appl Opt
, vol.46
, Issue.23
, pp. 5719-5727
-
-
Fu, Y.1
Pedrini, G.2
Osten, W.3
-
17
-
-
0015125275
-
Testing aspherics using two-wavelength holography
-
Wyant J.C. Testing aspherics using two-wavelength holography. Appl Opt 10 9 (1971) 2113-2118
-
(1971)
Appl Opt
, vol.10
, Issue.9
, pp. 2113-2118
-
-
Wyant, J.C.1
-
18
-
-
0015667946
-
Two-wavelength interferometry
-
Polhemus C. Two-wavelength interferometry. Appl Opt 12 9 (1973) 2071-2074
-
(1973)
Appl Opt
, vol.12
, Issue.9
, pp. 2071-2074
-
-
Polhemus, C.1
-
19
-
-
0040029477
-
Two-wavelength double heterodyne interferometry using a matched grating technique
-
Sodnik Z., Fischer E., Ittner T., and Tiziani H.J. Two-wavelength double heterodyne interferometry using a matched grating technique. Appl Opt 30 22 (1991) 3139-3144
-
(1991)
Appl Opt
, vol.30
, Issue.22
, pp. 3139-3144
-
-
Sodnik, Z.1
Fischer, E.2
Ittner, T.3
Tiziani, H.J.4
-
20
-
-
0032592355
-
Time-multiplex two-wavelength heterrodyne interferometer with frequency-ramped laser diodes
-
Onodera R., and Ishii Y. Time-multiplex two-wavelength heterrodyne interferometer with frequency-ramped laser diodes. Opt Commun 167 (1999) 47-51
-
(1999)
Opt Commun
, vol.167
, pp. 47-51
-
-
Onodera, R.1
Ishii, Y.2
-
21
-
-
84925486651
-
Two-wavelength phase shifting interferometry
-
Cheng Y.Y., and Wyant J.C. Two-wavelength phase shifting interferometry. Appl Opt 23 24 (1984) 4539-4543
-
(1984)
Appl Opt
, vol.23
, Issue.24
, pp. 4539-4543
-
-
Cheng, Y.Y.1
Wyant, J.C.2
-
22
-
-
84975605185
-
Three-color laser-diode interferometer
-
de Groot P.J. Three-color laser-diode interferometer. Appl Opt 30 25 (1991) 3612-3616
-
(1991)
Appl Opt
, vol.30
, Issue.25
, pp. 3612-3616
-
-
de Groot, P.J.1
-
23
-
-
0000862532
-
Real-time displacement measurement with a two-wavelength sinusoidal phase-modulating laser diode interferometer
-
Suzuki T., Kobayashi K., and Sasaki O. Real-time displacement measurement with a two-wavelength sinusoidal phase-modulating laser diode interferometer. Appl Opt 39 16 (2000) 2646-2652
-
(2000)
Appl Opt
, vol.39
, Issue.16
, pp. 2646-2652
-
-
Suzuki, T.1
Kobayashi, K.2
Sasaki, O.3
-
24
-
-
84975624303
-
Two-wavelength sinusoidal phase/modulating laser-diode interferometer insensitive to external disturbances
-
Sasaki O., Sasazaki H., and Suzuki T. Two-wavelength sinusoidal phase/modulating laser-diode interferometer insensitive to external disturbances. Appl Opt 30 28 (1991) 4040-4045
-
(1991)
Appl Opt
, vol.30
, Issue.28
, pp. 4040-4045
-
-
Sasaki, O.1
Sasazaki, H.2
Suzuki, T.3
-
25
-
-
84975585813
-
Two-wavelength laser-diode interferometer with fractional fringe techniques
-
Onodera R., and Ishii Y. Two-wavelength laser-diode interferometer with fractional fringe techniques. Appl Opt 34 22 (1995) 4740-4746
-
(1995)
Appl Opt
, vol.34
, Issue.22
, pp. 4740-4746
-
-
Onodera, R.1
Ishii, Y.2
-
26
-
-
0000146504
-
Two-wavelength interferometry that uses a Fourier-transform method
-
Onodera R., and Ishii Y. Two-wavelength interferometry that uses a Fourier-transform method. Appl Opt 37 34 (1998) 7988-7994
-
(1998)
Appl Opt
, vol.37
, Issue.34
, pp. 7988-7994
-
-
Onodera, R.1
Ishii, Y.2
-
27
-
-
17644423213
-
Step height measurement using two-wavelength phase-shifting interferometry
-
Creath K. Step height measurement using two-wavelength phase-shifting interferometry. Appl Opt 26 14 (1987) 2810-2816
-
(1987)
Appl Opt
, vol.26
, Issue.14
, pp. 2810-2816
-
-
Creath, K.1
-
29
-
-
31844448303
-
-
Ohlidal M, Sir L, Jakl M, Ohlidal I. Digital two-wavelength holographic interference microscopy for surface roughness measurement. In: Proc SPIE. 5945. 2005, pp. 594501-1-7.
-
Ohlidal M, Sir L, Jakl M, Ohlidal I. Digital two-wavelength holographic interference microscopy for surface roughness measurement. In: Proc SPIE. Vol. 5945. 2005, pp. 594501-1-7.
-
-
-
-
30
-
-
0001217930
-
Pulsed digital holographic interferometry with 694- and 347-nm wavelengths
-
Pedrini G., Tiziani H.J., and Gusev M.E. Pulsed digital holographic interferometry with 694- and 347-nm wavelengths. Appl Opt 39 2 (2000) 246-249
-
(2000)
Appl Opt
, vol.39
, Issue.2
, pp. 246-249
-
-
Pedrini, G.1
Tiziani, H.J.2
Gusev, M.E.3
-
31
-
-
34250221128
-
Real-time dual-wavelength digital holographic microscopy with a single hologram acquisition
-
Kühn J., Colomb T., Montfort F., Charrière F., Emery Y., Cuche E., et al. Real-time dual-wavelength digital holographic microscopy with a single hologram acquisition. Opt. Express 15 12 (2007) 7231-7242
-
(2007)
Opt. Express
, vol.15
, Issue.12
, pp. 7231-7242
-
-
Kühn, J.1
Colomb, T.2
Montfort, F.3
Charrière, F.4
Emery, Y.5
Cuche, E.6
-
32
-
-
80051713061
-
Speckle Phenomena in Optics, Theory and Application
-
Goodman JW. Speckle Phenomena in Optics, Theory and Application. Ben Roberts 2007.
-
(2007)
Ben Roberts
-
-
Goodman, J.W.1
-
34
-
-
39849089486
-
Kinematic and deformation parameter measurement by spatio-temporal analysis of an interferogram sequence
-
Fu Y., Groves R.M., Pedrini G., and Osten W. Kinematic and deformation parameter measurement by spatio-temporal analysis of an interferogram sequence. Appl Opt 46 36 (2007) 8645-8655
-
(2007)
Appl Opt
, vol.46
, Issue.36
, pp. 8645-8655
-
-
Fu, Y.1
Groves, R.M.2
Pedrini, G.3
Osten, W.4
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