Measurement of transient deformations with dual-pulse addition electronic speckle-pattern interferometry

Applied Optics

Volumn 37, Issue 31, 1998, Pages 7259-7267

  Farrant, David I ^a,b   Kaufmann, Guillermo H ^a,c   Petzing, Jon N ^a   Tyrer, John R ^a   Oreb, Bob F ^b   Kerr, David ^a  

^a LOUGHBOROUGH UNIVERSITY   (United Kingdom)

^b CSIRO   (Australia)

^c INSTITUTO DE FÍSICA ROSARIO   (Argentina)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 18844460904     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.37.007259     Document Type: Article

References (21)

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