Interferometric deformation measurement using object-induced dynamic phase-shifting

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2782, Issue , 2004, Pages 169-179

  Colonna De Lega, Xavier ^a   Jacquot, Pierre M ^a  

^a SWISS FEDERAL INSTITUTE OF TECHNOLOGY   (Switzerland)

Author keywords

deformation measurement; dynamic phenomenon; phase shifting

Indexed keywords

DEFORMATION MEASUREMENTS; DYNAMIC PHASE; DYNAMIC PHENOMENON; INDUCED PHASE CHANGE; INSTANTANEOUS PHASE; INTERFEROMETRIC DEFORMATION; PHASE-SHIFTING; PHASE-SHIFTING ALGORITHM; RELATIVE DISPLACEMENT; SPECKLE INTERFEROMETRY; TEMPORAL PHASE;

HOLOGRAPHIC INTERFEROMETRY; OPTICAL TESTING; SPECKLE;

DEFORMATION;

EID: 78951486040     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.250742     Document Type: Conference Paper

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