Two-wavelength interferometry that uses a Fourier-transform method

Applied Optics

Volumn 37, Issue 34, 1998, Pages 7988-7994

  Onodera, Ribun ^a   Ishii, Yukihiro ^a  

^a Employment Promotion Project Corporation   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000146504     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.37.007988     Document Type: Article

References (26)

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