THz detection by field-effect transistors in magnetic fields: Shallow water vs deep water mechanism of electron plasma instability

International Journal of High Speed Electronics and Systems

Volumn 18, Issue 4, 2008, Pages 949-958

  Sakowicz, M ^a   Usakowski, J ^a   Karpierz, K ^a   Grynberg, M ^a   Knap, W ^a,e,f   Kohler K ^b   Valusis G ^c   Goaszewska, K ^d   Kamiska, E ^d   Piotrowska, A ^d  

^a UNIVERSITY OF WARSAW   (Poland)

^b FRAUNHOFER INSTITUTE FOR APPLIED SOLID STATE PHYSICS IAF   (Germany)

^c CENTER FOR PHYSICAL SCIENCES AND TECHNOLOGY   (Lithuania)

^d Department of Micro and Nanotechnology of Wide Bandgap Semiconductors   (Poland)

^e TOHOKU UNIVERSITY   (Japan)

^f UNIV MONTPELLIER   (France)

Author keywords

[No Author keywords available]

Indexed keywords

BATHYMETRY; ELECTROMAGNETIC FIELDS; ELECTRON MOBILITY; FIELD EFFECT TRANSISTORS; FOURIER TRANSFORMS; MAGNETIC FIELDS; MAGNETOHYDRODYNAMICS; PLASMA DIAGNOSTICS; PLASMAS; RADIATION EFFECTS; SEMICONDUCTING GALLIUM;

ANTENNA EFFECTS; DEEP WATERS; DETECTION SIGNALS; ELECTRON PLASMAS; EXPERIMENTAL EVIDENCES; GATE VOLTAGES; HIGH ELECTRON MOBILITIES; LARGE AMPLITUDES; PHOTOVOLTAGE; PLASMA INSTABILITIES; SHALLOW WATERS; SHUBNIKOV-DE HAAS OSCILLATIONS; SMALL AMPLITUDES; SOURCE DRAINS; THEORETICAL MODELS; THZ DETECTIONS; THZ RADIATIONS;

PLASMA STABILITY;

EID: 60749104208     PISSN: 01291564     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0129156408005904     Document Type: Article

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