Plasma wave resonant detection of femtosecond pulsed terahertz radiation by a nanometer field-effect transistor

Applied Physics Letters

Volumn 87, Issue 2, 2005, Pages

  Teppe, F ^a,b   Veksler, D ^c   Kachorovski, V Yu ^a   Dmitriev, A P ^a   Xie, X ^c   Zhang, X C ^c   Rumyantsev, S ^a   Knap, W ^a,b   Shur, M S ^a,c  

^a RENSSELAER POLYTECHNIC INSTITUTE   (United States)

^b UNIV MONTPELLIER   (France)

^c RENSSELAER POLYTECHNIC INSTITUTE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DRAIN CURRENT; NANOMETER TRANSISTORS; TETRAHERTZ;

DETECTORS; IMAGING TECHNIQUES; PLASMA WAVES; RADIATION; SPECTROSCOPIC ANALYSIS; STABILITY;

FIELD EFFECT TRANSISTORS;

EID: 24144493733     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1952578     Document Type: Article

References (24)

1. M. Bass, P. A. Franken, J. F. Ward, and G. Weinreich, Phys. Rev. Lett. 9, 446 (1962).
2. B. Ferguson and X.-C. Zhang, Nat. Mater. 1, 26 (2002).
3. B. S. Karasik, W. R. McGrath, M. E. Gershenson, and A. V. Sergeev, J. Appl. Phys. 87, 7586 (2000).
4. S. M. Marazita, W. L. Bishop, J. L. Hesler, K. Hui, W. B. Bowen, and T. W. Crowe, IEEE Trans. Electron Devices 47, 1152 (2000).
5. J. Q. Wang, P. L. Richards, J. W. Beeman, and E. E. Haller, Appl. Opt. 26, 4767 (1987).
6. M. Dyakonov and M. S. Shur, IEEE Trans. Electron Devices 43, 380 (1996).
7. W. Knap, Y. Deng, S. Rumyantsev, and M. S. Shur, Appl. Phys. Lett. 0003-6951 10.1063/1.1525851 81, 4637 (2002); W. Knap, Y. Deng, S. Rumyantsev, J.-Q. Lü, M. S. Shur, C. A. Saylor, and L. C. Brunel, Appl. Phys. Lett. 80, 3433 (2002).
8. W. Knap, Y. Deng, S. Rumyantsev, and M. S. Shur, Appl. Phys. Lett. 0003-6951 10.1063/1.1525851 81, 4637 (2002); W. Knap, Y. Deng, S. Rumyantsev, J.-Q. Lü, M. S. Shur, C. A. Saylor, and L. C. Brunel, Appl. Phys. Lett. 80, 3433 (2002).
9. F. Teppe, D. Veksler, V. Yu. Kachorovski, A. P. Dmitriev, S. Rumyantsev, W. Knap, and M. S. Shur (unpublished).
10. X. G. Peralta, S. J. Allen, and M. C. Wankee, Appl. Phys. Lett. 81, 1627 (2002); X. Peralta, S. J. Allen, M. C. Wanke, N. E. Harff, M. P. Lilly, J. A. Simmons, J. L. Reno, P. J. Burke, J. P. Eisenstein, Wojtek Knap, Y. Deng, S. Rumyantsev, J.-Q. Lü, and M. S. Shur, in Frontiers in Electronics: Future Chips, Proceedings of the 2002 Workshop on Frontiers in Electronics (WOFE-02), St. Croix, Virgin Islands, 15 January 2003 (World Scientific, Singapore, 2003), Vol. 26 [Int. J. High Speed Electron. Syst. 12, 925 (2002)].
11. X. G. Peralta, S. J. Allen, and M. C. Wankee, Appl. Phys. Lett. 81, 1627 (2002);
12. X. Peralta, S. J. Allen, M. C. Wanke, N. E. Harff, M. P. Lilly, J. A. Simmons, J. L. Reno, P. J. Burke, J. P. Eisenstein, Wojtek Knap, Y. Deng, S. Rumyantsev, J.-Q. Lü, and M. S. Shur, in Frontiers in Electronics: Future Chips, Proceedings of the 2002 Workshop on Frontiers in Electronics (WOFE-02), St. Croix, Virgin Islands, 15 January 2003 (World Scientific, Singapore, 2003), Vol. 26
13. [Int. J. High Speed Electron. Syst. 12, 925 (2002)].
14. W. Knap, J. Lusakowski, T. Parenty, S. Bollaert, A. Cappy, V. V. Popov, and M. S. Shur, Appl. Phys. Lett. 84, 2331 (2004).
15. T. Yajima and K. Inoue, IEEE J. Quantum Electron. QE-5, 140 (1969).
16. X.-C. Zhang, Y. Jin, and X. F. Ma, Appl. Phys. Lett. 61, 2764 (1992).
17. A. Rice, Y. Jin, X. F. Ma, X. C. Zhang, D. Bliss, J. Perkin, and M. Alexander, Appl. Phys. Lett. 64, 1324 (1994).
18. Fujitsu Microwave Semiconductor Databook (1999), Fujitsu Compound Semiconductor Inc., 2355 Zanker Rd., San Jose, CA 95131-1138.
19. M. Dyakonov and M. S. Shur, in the Proceedings of 22d International Symposium on GaAs and Related Compounds, Cheju, Korea, 28 Aug.-1 Sep. 1995 [Inst. Phys. Conf. Ser. 145, 785 (1996)].
20. D. Veksler, F. Teppe, A. P. Dmitriev, V. Yu. Kachorovskii, W. Knap, and M. S. Shur (unpublished).
21. M. Dyakonov and M. S. Shur, Phys. Rev. Lett. 71, 2465 (1993).
22. A. Satou, I. Khmyrova, V. Ryzhii, and M. S. Shur, Semicond. Sci. Technol. 18, 460 (2003).
23. V. L. Kustov, V. I. Ryzhii, and Yu. S. Sigov, Sov. Phys. JETP 52, 1207 (1980).
24. V. Yu. Kachorovskii, I. S. Lyubinskiy, and L. D. Tsendin, Phys. Rev. B 68, 033308 (2003).