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Volumn 45, Issue 2, 2009, Pages 833-838

Advanced lithography for bit patterned media

Author keywords

Advanced lithography; Bit patterned media; Directed self assembly; Nanoimprint lithography

Indexed keywords

DEFECTS; PHOTORESISTS;

EID: 60449108075     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2008.2010647     Document Type: Article
Times cited : (27)

References (16)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.