Pure experimental determination of surface recombination properties with high reliability

Proceedings of the 3rd World Conference on Photovoltaic Energy Conversion

Volumn B, Issue , 2003, Pages 1073-1076

  Kampwerth, H ^a   Rein, S ^a   Glunz, S W ^a  

^a FRAUNHOFER INSTITUTE FOR SOLAR ENERGY SYSTEMS ISE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

INFEED GRINDING; OXIDE PASSIVATION; PASSIVATION LAYERS; SURFACE RECOMBINATION;

DOPING (ADDITIVES); EIGENVALUES AND EIGENFUNCTIONS; ELECTRIC POWER SYSTEMS; ERROR ANALYSIS; MATHEMATICAL MODELS; OPTIMIZATION; PASSIVATION; SILICON WAFERS;

SILICON SOLAR CELLS;

EID: 6044227498     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)

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