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Volumn , Issue , 2008, Pages 273-280

Transient Fault Tolerance on Chip Multiprocessor based on Dual and Triple Core Redundancy1

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; ELECTRIC REACTORS; ERRORS; FAILURE ANALYSIS; FAULT DETECTION; FAULT TOLERANCE; FAULT TOLERANT COMPUTER SYSTEMS; FAULT TREE ANALYSIS; MICROPROCESSOR CHIPS; MULTIPROCESSING SYSTEMS; QUALITY ASSURANCE; REDUNDANCY; SYSTEMS ANALYSIS; TELECOMMUNICATION SYSTEMS; THERMAL CONDUCTIVITY OF SOLIDS;

EID: 60349111201     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PRDC.2008.40     Document Type: Conference Paper
Times cited : (11)

References (9)
  • 2
    • 0034789870 scopus 로고    scopus 로고
    • Impact of CMOS scaling and SOI on soft error rates of logic processes
    • Digest of Technical Papers, pp
    • S. Hareland, et al "Impact of CMOS scaling and SOI on soft error rates of logic processes," Symposium on VLSI Technology, Digest of Technical Papers, pp. 73-74, 2001
    • (2001) Symposium on VLSI Technology , pp. 73-74
    • Hareland, S.1
  • 8
    • 15044350862 scopus 로고    scopus 로고
    • Fingerprinting: Bounding Soft-Error-Detection Latency and Bandwidth
    • J.C. Smolens, et al, "Fingerprinting: Bounding Soft-Error-Detection Latency and Bandwidth," IEEE Micro, vol.24, no. 6, pp. 22-29, 2004.
    • (2004) IEEE Micro , vol.24 , Issue.6 , pp. 22-29
    • Smolens, J.C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.