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Volumn 27, Issue 1, 2009, Pages 459-462

Investigation of Bias-Temperature Instability in work-function-tuned high- k/metal-gate stacks

Author keywords

[No Author keywords available]

Indexed keywords

GATE DIELECTRICS; GATES (TRANSISTOR); METAL RECOVERY;

EID: 59949094791     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.3054352     Document Type: Article
Times cited : (7)

References (11)
  • 1
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    • A. Veloso, Proceedings of the 2008 International Symposium on VLSI Technology (IEEE, Piscataway, NJ, 2008), p. 14.
    • (2008) , pp. 14
    • Veloso, A.1
  • 3
    • 85190287103 scopus 로고    scopus 로고
    • Proceedings of the 2007 International Integrated Reliability Workshop, (IEEE, Piscataway, NJ, 2007), 6.
    • T. Grasser, P.-J. Wagner, Ph. Hehenberger, W. Gös, and B. Kaczer, Proceedings of the 2007 International Integrated Reliability Workshop, 2007 (IEEE, Piscataway, NJ, 2007), p. 6.
    • (2007)
    • Grasser, T.1    Wagner, P.-J.2    Hehenberger, Ph.3    Gös, W.4    Kaczer, B.5
  • 4
    • 28744447129 scopus 로고    scopus 로고
    • Proceedings of the 2005 IEEE International Reliability Physics Symposium, (IEEE, Piscataway, NJ, 2005),.
    • B. Kaczer, V. Arkhipov, R. Degraeve, N. Collaert, G. Groeseneken, and M. Goodwin, Proceedings of the 2005 IEEE International Reliability Physics Symposium, 2005 (IEEE, Piscataway, NJ, 2005), p. 381.
    • (2005) , pp. 381
    • Kaczer, B.1    Arkhipov, V.2    Degraeve, R.3    Collaert, N.4    Groeseneken, G.5    Goodwin, M.6
  • 6
    • 59949087333 scopus 로고    scopus 로고
    • Proceedings of the 2006 IEEE International Reliability Physics Symposium, (IEEE, Piscataway, NJ, 2006),.
    • M. Denais, Proceedings of the 2006 IEEE International Reliability Physics Symposium, 2006 (IEEE, Piscataway, NJ, 2006), p. 735.
    • (2006) , pp. 735
    • Denais, M.1
  • 7
    • 51549089429 scopus 로고    scopus 로고
    • Proceedings of the 2008 IEEE International Reliability Symposium, (IEEE, Piscataway, NJ, 2008),.
    • T. Grasser, B. Kaczer, and W. Gös, Proceedings of the 2008 IEEE International Reliability Symposium, 2008 (IEEE, Piscataway, NJ, 2008), p. 28.
    • (2008) , pp. 28
    • Grasser, T.1    Kaczer, B.2    Gös, W.3
  • 9
    • 59949094827 scopus 로고    scopus 로고
    • (private communication).
    • S. Zafar (private communication).
    • Zafar, S.1
  • 11
    • 59949099928 scopus 로고    scopus 로고
    • Proceedings of the 2008 International Symposium on VLSI Technology (IEEE, Piscataway, NJ),.
    • S. Z. Chang, Proceedings of the 2008 International Symposium on VLSI Technology (IEEE, Piscataway, NJ, 2008), p. 62.
    • (2008) , pp. 62
    • Chang, S.Z.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.