메뉴 건너뛰기




Volumn 94, Issue 4, 2009, Pages 889-897

Measurement of femtosecond laser-induced damage and ablation thresholds in dielectrics

Author keywords

[No Author keywords available]

Indexed keywords

ABLATION; DIELECTRIC MATERIALS; FEMTOSECOND LASERS; LASER ABLATION; LASER PULSES; MICROMACHINING;

EID: 59749092338     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s00339-009-5077-6     Document Type: Article
Times cited : (107)

References (41)
  • 26
    • 0003434416 scopus 로고
    • University Science Books Mill Valley
    • A.E. Siegman, Lasers (University Science Books, Mill Valley, 1986)
    • (1986) Lasers
    • Siegman, A.E.1
  • 35
    • 41149099486 scopus 로고    scopus 로고
    • Influence of the beam-focus size on femtosecond laser-induced damage threshold in fused silica
    • Commercial and Biomedical Applications of Ultrafast Lasers VIII SPIE Bellingham
    • N. Sanner, B. Bussiere, O. Utéza, A. Leray, T. Itina, M. Sentis, J.Y. Natoli, M. Commandré: Influence of the beam-focus size on femtosecond laser-induced damage threshold in fused silica. In Commercial and Biomedical Applications of Ultrafast Lasers VIII, ed. by J. Neev, S. Nolte, A. Heisterkamp, C.B. Shaffer. Proc. of SPIE, vol. 6881. (SPIE, Bellingham, 2008), pp. 68810W-1-68810W-9
    • (2008) Proc. of SPIE , vol.6881
    • Sanner, N.1    Bussiere, B.2    Utéza, O.3    Leray, A.4    Itina, T.5    Sentis, M.6    Natoli, J.Y.7    Commandré, M.8    Neev, J.9    Nolte, S.10    Heisterkamp, A.11    Shaffer, C.B.12


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.