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Volumn 6881, Issue , 2008, Pages

Influence of the beam-focus size on femtosecond laser-induced damage threshold in fused silica

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; FUSED SILICA; LASER BEAMS; MICROMETERS;

EID: 41149099486     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.762767     Document Type: Conference Paper
Times cited : (17)

References (14)
  • 4
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    • optimized metrology for laser damage measurement : Application to multiparameter study
    • L. Gallais, J.Y. Natoli, optimized metrology for laser damage measurement : application to multiparameter study, Appl. Opt. 42, 960 (2003)
    • (2003) Appl. Opt , vol.42 , pp. 960
    • Gallais, L.1    Natoli, J.Y.2
  • 5
    • 0028766486 scopus 로고
    • Laser-induced breakdown by impact ionization in SiO2 with pulse widths from 7 ns to 150 fs
    • D. Du, X. Liu, G. Korn, J. Squier, and G. Mourou, Laser-induced breakdown by impact ionization in SiO2 with pulse widths from 7 ns to 150 fs, Appl. Phys. Lett. 64, 3071 (1994).
    • (1994) Appl. Phys. Lett , vol.64 , pp. 3071
    • Du, D.1    Liu, X.2    Korn, G.3    Squier, J.4    Mourou, G.5
  • 7
    • 0003434416 scopus 로고
    • University Science Books, Mill Valley CA
    • A.E. Siegman, Lasers (University Science Books, Mill Valley CA, 1986).
    • (1986) Lasers
    • Siegman, A.E.1
  • 11
    • 0142118317 scopus 로고    scopus 로고
    • Spot-size dependence of the ablation threshold in dielectrics for femtosecond laser pulses
    • S. Martin, A. Hertwig, M. Lenzner, J. Krüger, W. Kautek, "Spot-size dependence of the ablation threshold in dielectrics for femtosecond laser pulses", Appl. Phys. A 77, 883 - 884, 2003.
    • (2003) Appl. Phys. A , vol.77 , pp. 883-884
    • Martin, S.1    Hertwig, A.2    Lenzner, M.3    Krüger, J.4    Kautek, W.5
  • 12
    • 5544249623 scopus 로고
    • Role of coating defects in laser-induced damage to dielectric thin films
    • L.G. DeShazer, B.E. Newnam, K.M. Leung, "Role of coating defects in laser-induced damage to dielectric thin films", Appl. Phys. Lett. 23 (11), 607-609, 1973.
    • (1973) Appl. Phys. Lett , vol.23 , Issue.11 , pp. 607-609
    • DeShazer, L.G.1    Newnam, B.E.2    Leung, K.M.3
  • 14
    • 5444256908 scopus 로고    scopus 로고
    • Ultra-short pulse laser interaction with transparent dielectrics
    • M.D. Feit, A.M. Komashko, A.M. Rubenchik, Ultra-short pulse laser interaction with transparent dielectrics, Appl. Phys. A 79, 1657 (2004).
    • (2004) Appl. Phys. A , vol.79 , pp. 1657
    • Feit, M.D.1    Komashko, A.M.2    Rubenchik, A.M.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.