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Journal of Materials Science: Materials in Electronics

Volumn 20, Issue 4, 2009, Pages 328-333

Microstructure studies of ZnO nanoneedles

(5) Chen, Yuxi a Qu, Bing b Barnakov, Yuri A c Tang, Qunli a Chen, Jianghua a

a HUNAN UNIVERSITY (China)

b China Railway First Group Co Ltd (China)

c NORFOLK STATE UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPIC GROWTHS; AXIAL GROWTHS; CONVERGENT-BEAM ELECTRON DIFFRACTIONS; GROWTH FRONTS; HIGH INDICES; HIGH-RESOLUTION ELECTRON MICROSCOPIES; SCANNING ELECTRONS; SLOPE SURFACES; UNIFORM DIAMETERS; ZNO; ZNO NANONEEDLES; ZNO NANOPARTICLES; ZNO NANORODS;

ELECTRON DIFFRACTION; ELECTRON MICROSCOPY; GROWTH (MATERIALS); HIGH RESOLUTION ELECTRON MICROSCOPY; MICROSTRUCTURE; NANONEEDLES; NANOPARTICLES; SCANNING ELECTRON MICROSCOPY; STACKING FAULTS; THERMAL EVAPORATION; ZINC; ZINC OXIDE;

SEMICONDUCTING ZINC COMPOUNDS;

EID: 59749090084 PISSN: 09574522 EISSN: 1573482X Source Type: Journal
DOI: 10.1007/s10854-008-9729-7 Document Type: Article

Times cited : (4)

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