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Volumn , Issue , 2007, Pages 237-240

Dynamic Data Stability in Low-power SRAM Design

Author keywords

[No Author keywords available]

Indexed keywords

CELLS; CYTOLOGY; INTEGRATED CIRCUITS; LOGIC DESIGN; STABILITY; STABILITY CRITERIA; STATIC RANDOM ACCESS STORAGE;

EID: 59349089392     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CICC.2007.4405722     Document Type: Conference Paper
Times cited : (6)

References (9)
  • 1
    • 2342604350 scopus 로고
    • Noise margin and noise immunity of logic circuits
    • C. F. Hill, "Noise margin and noise immunity of logic circuits, ". Microelectron., 1968, vol. 1, pp. 16-21.
    • (1968) Microelectron. , vol.1 , pp. 16-21
    • Hill, C.F.1
  • 2
    • 0020906578 scopus 로고
    • Worst-case static noise margin criteria for logic circuits and their mathematical equivalence
    • Dec
    • J. Lohstroh, E. Seevinck, J. de Groot, "Worst-case static noise margin criteria for logic circuits and their mathematical equivalence, " IEEE Journal of Solid-State Circuits, Volume 18, Issue 6, pp. 803-807, Dec 1983.
    • (1983) IEEE Journal of Solid-State Circuits , vol.18 , Issue.6 , pp. 803-807
    • Lohstroh, J.1    Seevinck, E.2    De Groot, J.3
  • 4
    • 33846259499 scopus 로고    scopus 로고
    • Wordline and bitline pulsing schemes for improving SRAM cell stability in low-vcc 65nm CMOS designs
    • M. Khellah et al., "Wordline and bitline pulsing schemes for improving SRAM cell stability in low-vcc 65nm CMOS designs, " IEEE Symp. on VLSI Circuits Digest of Tech. Papers, pp. 9-10, 2006.
    • (2006) IEEE Symp. on VLSI Circuits Digest of Tech. Papers , pp. 9-10
    • Khellah, M.1
  • 5
    • 39749201604 scopus 로고    scopus 로고
    • An SRAM design in 65nm and 45nm technology nodes eaturing read and write-Assist circuits to expand operating voltage
    • H. Pilo, et. al, "An SRAM design in 65nm and 45nm technology nodes eaturing read and write-Assist circuits to expand operating voltage" Symposium on VLSI Circuits, Digest of Technical Papers. 15-17, 2006.
    • (2006) Symposium on VLSI Circuits, Digest of Technical Papers , pp. 15-17
    • Pilo, H.1
  • 8
    • 34548858947 scopus 로고    scopus 로고
    • A 65nm 8T sub-Vt SRAM employing sense-amplifier redundancy
    • Feb.
    • N. Verma and A. Chandrakasan, "A 65nm 8T sub-Vt SRAM employing sense-amplifier redundancy, " IEEE ISSCC Digest of Tech. Papers, pp. 328-329, Feb. 2007.
    • (2007) IEEE ISSCC Digest of Tech. Papers , pp. 328-329
    • Verma, N.1    Chandrakasan, A.2
  • 9
    • 34548830136 scopus 로고    scopus 로고
    • A sub-200mv 6T SRAM in 0. 13u CMOS
    • Feb.
    • B. Zhai et al., "A sub-200mv 6T SRAM in 0. 13u CMOS, " IEEE ISSCC Digest of Tech. Papers, pp. 332-333, Feb. 2007.
    • (2007) IEEE ISSCC Digest of Tech. Papers , pp. 332-333
    • Zhai, B.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.