Analysis of 3D elemental mapping artefacts in biological specimens using Monte Carlo simulation

Journal of Microscopy

Volumn 233, Issue 2, 2009, Pages 331-339

  Scott, K ^a   Ritchie, N W M ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

3D elemental mapping; Diatom; EDS; FIB; Focused ion beam; Monte Carlo; SEM; X ray microanalysis

Indexed keywords

BIOINFORMATICS; ELECTRON PROBE MICROANALYSIS; FOCUSED ION BEAMS; INTELLIGENT SYSTEMS; MAPPING; MONTE CARLO METHODS; SCANNING ELECTRON MICROSCOPY; X RAY ANALYSIS;

3D ELEMENTAL MAPPING; BIOLOGICAL SPECIMENS; DIATOM; ELEMENTAL MAPPING; FIB; FOCUSED IONS BEAMS; MODEL ORGANISMS; MONTE CARLO; MONTE CARLO'S SIMULATION; X-RAY MICROANALYSIS;

NANOPARTICLES;

NANOPARTICLE;

ARTICLE; ARTIFACT; CHLOROPLAST; DIATOM; GEOMETRY; INFORMATION PROCESSING; MICROANALYSIS; MONTE CARLO METHOD; NONHUMAN; PRIORITY JOURNAL; SENSITIVITY ANALYSIS; THALASSIOSIRA PSEUDONANA; X RAY MICROANALYSIS;

BACILLARIOPHYTA; NITZSCHIA ALBA; THALASSIOSIRA PSEUDONANA;

EID: 59149099801     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2009.03124.x     Document Type: Article

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