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Volumn 11, Issue 2, 2009, Pages 467-471
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Effect of negative substrate bias on HWCVD deposited nanocrystalline silicon (nc-Si) films
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Author keywords
FESEM; HWCVD; nc Si; Raman
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Indexed keywords
CRYSTALLITE SIZE;
ELECTRODEPOSITION;
EMISSION SPECTROSCOPY;
FIELD EMISSION;
NANOCRYSTALLINE ALLOYS;
NANOCRYSTALLINE MATERIALS;
NANOCRYSTALLINE SILICON;
SCANNING ELECTRON MICROSCOPY;
SILICON;
SUBSTRATES;
X RAY DIFFRACTION;
CRYSTALLINE FRACTIONS;
FESEM;
FIELD EMISSION-SCANNING ELECTRON MICROSCOPIES;
HOT-WIRE CHEMICAL VAPOR DEPOSITIONS;
HWCVD;
MICROSTRUCTURAL CHARACTERISTICS;
NANO-CRYSTALLINE;
NC-SI;
NEGATIVE BIAS;
NEGATIVE SUBSTRATES;
RAMAN;
SI FILMS;
STRUCTURAL CHARACTERIZATIONS;
X- RAY DIFFRACTIONS;
X-RAY REFLECTIVITIES;
SEMICONDUCTING SILICON COMPOUNDS;
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EID: 58949102920
PISSN: 12932558
EISSN: None
Source Type: Journal
DOI: 10.1016/j.solidstatesciences.2008.08.004 Document Type: Article |
Times cited : (17)
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References (23)
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