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Volumn 11, Issue 2, 2009, Pages 467-471

Effect of negative substrate bias on HWCVD deposited nanocrystalline silicon (nc-Si) films

Author keywords

FESEM; HWCVD; nc Si; Raman

Indexed keywords

CRYSTALLITE SIZE; ELECTRODEPOSITION; EMISSION SPECTROSCOPY; FIELD EMISSION; NANOCRYSTALLINE ALLOYS; NANOCRYSTALLINE MATERIALS; NANOCRYSTALLINE SILICON; SCANNING ELECTRON MICROSCOPY; SILICON; SUBSTRATES; X RAY DIFFRACTION;

EID: 58949102920     PISSN: 12932558     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solidstatesciences.2008.08.004     Document Type: Article
Times cited : (17)

References (23)
  • 11
    • 58949103334 scopus 로고    scopus 로고
    • W.C. Choi, E.K. Kim, S.K. Min, C.Y. Park, J.H. Kim, T.Y. Seong, Appl. Phys. Lett. 70.
    • W.C. Choi, E.K. Kim, S.K. Min, C.Y. Park, J.H. Kim, T.Y. Seong, Appl. Phys. Lett. 70.
  • 14
    • 58949099749 scopus 로고    scopus 로고
    • G. Yue, B. Yan, G. Ganguly, J. Yang, S. Guha, C.W. Teplin, D.L. Williamson, Proceedings of the Fourth World Conference on Photovoltaic Energy Conversion, Hawaii, USA, May 7-12, 2006.
    • G. Yue, B. Yan, G. Ganguly, J. Yang, S. Guha, C.W. Teplin, D.L. Williamson, Proceedings of the Fourth World Conference on Photovoltaic Energy Conversion, Hawaii, USA, May 7-12, 2006.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.