Multiple maximum exposure rates in computerized adaptive testing

Applied Psychological Measurement

Volumn 33, Issue 1, 2009, Pages 58-73

  Ramón Barrada, Juan ^a   Veldkamp, Bernard P ^b   Olea, Julio ^c  

^a UNIVERSITAT AUTÒNOMA DE BARCELONA   (Spain)

^b UNIVERSITY OF TWENTE   (Netherlands)

^c UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

Author keywords

Computerized adaptive testing; Item exposure control; Item selection; Test security

Indexed keywords

EID: 58849141316     PISSN: 01466216     EISSN: 15523497     Source Type: Journal    
DOI: 10.1177/0146621608315329     Document Type: Article

References (22)

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