Methods for restricting maximum exposure rate in computerized adaptative testing

Methodology

Volumn 3, Issue 1, 2007, Pages 14-23

  Barrada, Juan Ramon ^a   Olea, Julio ^a   Ponsoda, Vicente ^a  

^a UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

Author keywords

Computerized adaptive testing; Item bank security; Item exposure control; Overlap rate; Sympson Hetter method

Indexed keywords

EID: 56049111541     PISSN: 16141881     EISSN: 16142241     Source Type: Journal    
DOI: 10.1027/1614-2241.3.1.14     Document Type: Article

References (21)

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