Some Alternatives to Sympson-Hetter Item-Exposure Control in Computerized Adaptive Testing

Journal of Educational and Behavioral Statistics

Volumn 28, Issue 3, 2003, Pages 249-265

  Van der Linden, Wim J ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

Computerized adaptive testing; Item exposure control; Iterative adjustment of control parameters; Sympson Hetter method

Indexed keywords

EID: 0037647755     PISSN: 10769986     EISSN: None     Source Type: Journal    
DOI: 10.3102/10769986028003249     Document Type: Article

References (14)

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