Constraining item exposure in computerized adaptive testing with shadow tests

Journal of Educational and Behavioral Statistics

Volumn 29, Issue 3, 2004, Pages 273-291

  Van Der Linden, Wim J ^a,b   Veldkamp, Bernard P ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

^b STANFORD UNIVERSITY   (United States)

Author keywords

Computerized adaptive testing; Item exposure control; Item selection constraints; Randomized control; Shadow test approach

Indexed keywords

EID: 10044272968     PISSN: 10769986     EISSN: None     Source Type: Journal    
DOI: 10.3102/10769986029003273     Document Type: Article

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