Controlling item exposure and test overlap on the fly in computerized adaptive testing

British Journal of Mathematical and Statistical Psychology

Volumn 61, Issue 2, 2008, Pages 471-492

  Chen, Shu Ying ^a   Lei, Pui Wa ^b   Liao, Wen Han ^a  

^a NATIONAL CHUNG CHENG UNIVERSITY   (Taiwan)

^b PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; DECISION SUPPORT SYSTEM; HUMAN; PSYCHOLOGICAL MODEL;

DECISION MAKING, COMPUTER-ASSISTED; HUMANS; MODELS, PSYCHOLOGICAL;

EID: 56649091158     PISSN: 00071102     EISSN: None     Source Type: Journal    
DOI: 10.1348/000711007X227067     Document Type: Article

References (12)

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3. Chen, S., Ankenmann, R. D., & Spray, J. A. (2003). The relationship between item exposure and test overlap in computerized adaptive itsting. Journal of Educational Measurement, 40, 129-145.
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