Calculation of Angular-Dependent Reflectance and Polarimetry Spectra of Nanoporous Anodic Alumina-Based Photonic Crystal Slabs

Photonics and Nanostructures - Fundamentals and Applications

Volumn 7, Issue 1, 2009, Pages 12-18

  Král, Zdeněk ^a   Vojkůvka, Lukáš ^a   Garcia Caurel, Enric ^b   Ferré Borrull, Josep ^a   Marsal, Lluis F ^a   Pallarès, Josep ^a  

^a NePhoS   (Spain)

^b LABORATOIRE DE PHYSIQUE DES INTERFACES ET DES COUCHES MINCES   (France)

Author keywords

Numerical simulation; Optical characterization; Photonic crystals; Porous alumina; Spectroscopic polarimetry

Indexed keywords

ALUMINA; ALUMINUM OXIDE; ALUMINUM SHEET; COMPUTER SIMULATION; ELLIPSOMETRY; NUMERICAL MODELS; PERIODIC STRUCTURES; POLARIMETERS; POLARIZATION; REFLECTION;

CROSS POLARIZATIONS; NANOPOROUS ANODIC ALUMINAS; OFF-DIAGONAL COMPONENTS; OPTICAL CHARACTERIZATION; PHOTONIC CRYSTAL SLAB; POROUS ALUMINA; SPECTROSCOPIC POLARIMETRY; TWO-DIMENSIONAL PHOTONIC CRYSTALS;

PHOTONIC CRYSTALS;

EID: 58849098558     PISSN: 15694410     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.photonics.2008.11.005     Document Type: Article

References (38)

1. Yablonovitch E. Phys. Rev. Lett. 58 (1987) 2059
2. John S. Phys. Rev. Lett. 58 (1987) 2486
3. Joannopoulos J.D., Meade R.D., and Winn J.N. Photonic Crystals Molding the Flow of Light (1995), Princenton University Press, Princeton
4. Russell P. Science 299 (2003) 358
5. Park H., Kim S., Kwon S., Ju Y., Yang J., Baek J., Kim S., and Lee Y. Science 305 (2004) 1444
6. Akmansoy E., Centeno E., Vynck K., Cassagne D., and Lourtioz J. Appl. Phys. Lett. 92 (2008) 133501
7. Mertens G., Wehrspohn R.B., Kitzerow H.-S., Matthias S., Jamois C., and Gosele U. Appl. Phys. Lett. 87 (2005) 241108
8. Martinez L.J., Garcia-Martin A., and Postigo P.A. Opt. Exp. 12 (2004) 5684
9. Sugitatsu A., Asano T., and Noda S. Appl. Phys. Lett. 86 (2005) 171106
10. Masuda H., and Fukuda K. Science 268 (1995) 1466
11. Birner A., Gruning U., Ottow S., Schneider A., Muller F., Lehmann V., Foll H., and Gosele U. Phys. Status Solidi A: Appl. Res. 165 (1998) 111
12. Marsal L.F., Vojkuvka L., Ferre-Borrull J., Trifonov T., and Pallares J. Phys. Status Solidi (c) 4 (2007) 1918
13. R.B. Wehrspohn, A.P. Li, K. Nielsch, F. Müller, W. Erfurth, U. Gösele, in: K.R. Hebert, R.S. Lillard, B.R. Mac Dougall (Eds.), Oxide Films, PV-2000-4, Electrochemical Society Monographs, Pennington, NJ, 2000, p. 271.
14. Choi J., Nielsch K., Reiche M., Wehrspohn R.B., and Gosele U. J. Vac. Sci. Technol. B 21 (2003) 763
15. Lee W., Ji R., Gosele U., and Nielsch K. Nat. Mater. 5 (2006) 741
16. Takayama O., and Cada M. Appl. Phys. Lett. 85 (2004) 1311
17. Xu W.L., Zheng M.J., Wu S., and Shen W.Z. Appl. Phys. Lett. 85 (2004)
18. Labilloy D., Benisty H., Weisbuch C., Krauss T.F., De La Rue, Bardinal V., Houdré R., Oesterle U., Cassagne D., and Jouanin C. Phys. Rev. Lett. 79 (1997) 4147
19. Yablonovitch E., and Gmitter T.J. Phys. Rev. Lett. 63 (1989) 1950
20. Astratov V.N., Skolnick M.S., Brand S., Krauss T.F., Karimov O.Z., Stevenson R.M., Whittaker D.M., Culshaw I., and De la Rue R.M. IEE Proc. Optoelectron. 145 (1998) 398
21. Astratov V.N., Culshaw I.S., Stevenson R.M., Whittaker D.M., Skolnick M.S., Krauss T.F., and De la Rue R.M. J. Lightwave Technol. 17 (1999) 2050
22. Astratov V.N., Whittaker D.M., Culshaw I.S., Stevenson R.M., Skolnick M.S., Krauss T.F., and De La Rue R.M. Phys. Rev. B 60 (1999) R16255
23. Astratov V.N., Stevenson R.M., Culshaw I.S., Whittaker D.M., Skolnick M.S., Krauss T.F., and De La Rue R.M. Appl. Phys. Lett. 77 (2000) 178
24. Astratov V.N., Stevenson R.M., Culshaw I.S., Whittaker D.M., Skolnick M.S., Krauss T.F., and De la Rue R.M. Phys. Status Solidi A: Appl. Res. 178 (2000) 565
25. Alija A.R., Martinez L.J., Postigo P.A., Seassal C., and Viktorovitch P. Appl. Phys. Lett. 89 (2006) 101102
26. Kral Z., Ferre-Borrull J., Pallares J., Trifonov T., Rodriguez A., Alcubilla R., and Marsal L.F. Mater. Sci. Eng. B: Solid State Mater. Adv. Technol. 147 (2008) 179
27. Král Z., Ferré-Borrull J., Trifonov T., Marsal L.F., Rodriguez A., Pallarès J., and Alcubilla R. Thin Solid Films 516 (2008) 8059
28. Aspnes D.E. Thin Solid Films 455-56 (2004) 3
29. Novikova T., De Martino A., Ben Hatit S., and Drevillon B. Appl. Opt. 45 (2006) 3688
30. Tkachenko V., Abbate G., Marino A., Vita F., Giocondo M., Mazzulla A., and De Stefano L. Appl. Phys. Lett. 89 (2006) 221110
31. Arwin H., Poksinski M., and Johansen K. Phys. Status Solidi A: Appl. Mater. Sci. 205 (2008) 817
32. Netti M.C., Harris A., Baumberg J.J., Whittaker D.M., Charlton M.B.D., Zoorob M.E., and Parker G.J. Phys. Rev. Lett. 86 (2001) 1526
33. Garcia-Caurel E., De Martino A., and Drevillon B. Thin Solid Films 455-456 (2004) 120
34. Whittaker D.M., and Culshaw I.S. Phys. Rev. B 60 (1999) 2610
35. Azzam R.M.A., and Bashara N.M. Ellipsometry and Polarized Light (1977), North Holland, Amsterdam
36. Hovenier J.W. Appl. Opt. 33 (1994) 8318
37. Tan C., Peng C.S., Petryakov V.N., Verevkin Y.K., Zhang J., Wang Z., Olaizola S.M., Berthou T., Tisserand S., and Pessa M. New J. Phys. 10 (2008) 023023
38. Farhoud M., Ferrera J., Lochtefeld A.J., Murphy T.E., Schattenburg M.L., Carter J., Ross C.A., and Smith H.I. J. Vacuum Sci. Technol. B 17 (1999) 3182