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A frequency metrology system is being marketed by Menlo Systems GmbH (www.menlosystems.de).
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note
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I wish in particular to recognize my friends and colleagues J. Knight and T. Birks for their enthusiastic and creative involvement in the research over the years. I also wish to thank all the many graduate students, postdoctoral researchers, visitors, and collaborators in other institutions all over the world for their many valuable contributions.
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