Structural and optical characteristics of porous GaN generated by electroless chemical etching

Materials Letters

Volumn 63, Issue 8, 2009, Pages 724-727

  Yam, F K ^a   Hassan, Z ^a  

^a SCHOOL OF PHYSICS   (Malaysia)

Author keywords

Characterization methods; Optical materials and properties; Porosity

Indexed keywords

ATOMIC FORCE MICROSCOPY; ETCHING; FRICTION; GALLIUM ALLOYS; GALLIUM NITRIDE; LIGHT TRANSMISSION; OPTICAL MATERIALS; OPTICAL PROPERTIES; PLATINUM; POROSITY; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING GALLIUM; SURFACE PROPERTIES; SURFACE ROUGHNESS;

CHARACTERIZATION METHODS; CHEMICAL ETCHING; ELECTROLESS; FORCE MICROSCOPY; GROWN SAMPLE; OPTICAL MATERIALS AND PROPERTIES; OPTICAL TRANSMISSION MEASUREMENTS; PORE DENSITIES; RAMAN SPECTRUM;

CHEMICAL PROPERTIES;

EID: 58649124302     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2008.12.040     Document Type: Article

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