Control chart based on likelihood ratio for monitoring linear profiles

Computational Statistics and Data Analysis

Volumn 53, Issue 4, 2009, Pages 1440-1448

  Zhang, Jiujun ^a,b   Li, Zhonghua ^b   Wang, Zhaojun ^b  

^a LIAONING UNIVERSITY   (China)

^b NANKAI UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

MAXIMUM LIKELIHOOD ESTIMATION; MONTE CARLO METHODS; OPTOELECTRONIC DEVICES;

LIKELIHOOD RATIO (LR); MONTE CARLO SIMULATION (MCS); NEW METHODS; OPTICAL IMAGING; WIDE-RANGE;

FLOWCHARTING;

EID: 58549121151     PISSN: 01679473     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.csda.2008.12.002     Document Type: Article

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