The growth of thin NiO films on Ag(001) studied by scanning tunneling microscopy and spectroscopy

Surface and Interface Analysis

Volumn 40, Issue 13, 2008, Pages 1741-1746

  Großer, Stephan ^a   Hagendorf, Christian ^a,b   Neddermeyer, Henning ^a   Widdra, Wolf ^a  

^a MARTIN LUTHER UNIVERSITY HALLE WITTENBERG   (Germany)

^b FRAUNHOFER INSTITUTE FOR MECHANICS OF MATERIALS IWM   (Germany)

Author keywords

Ag(001); Growth; NiO; Oxide film; Scanning tunneling microscopy; Scanning tunneling spectroscopy

Indexed keywords

ANNEALING; ELECTRON ENERGY LEVELS; FILM GROWTH; FOURIER TRANSFORMS; GROWTH (MATERIALS); MONOLAYERS; OXIDE FILMS; SCANNING; SCANNING TUNNELING MICROSCOPY; SPECTRUM ANALYSIS; SUBSTRATES; SURFACES; TUNNELING (EXCAVATION);

AG(001); GROWTH; NIO; OXIDE FILM; SCANNING TUNNELING SPECTROSCOPY;

SILVER;

EID: 58449123142     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.2956     Document Type: Article

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